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A Mathematical Study of Irregularity Indices for the Silicon Carbide Lattice Si JERST
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Research Article

A Mathematical Study of Irregularity Indices for the Silicon Carbide Lattice Si p, q

MK Moazzma Kashaf ✉ HM Haseeba Mubeen MS Moiza Shaf
✉ Corresponding author
Journal: Journal of Emerging Research in Science and Technology Published: September 19, 2026
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Received
18 Jul 2026
Accepted
14 Sep 2026
Published
19 Sep 2026
Abstract
Graph theory has become an important tool in chemistry for analyzing and representing molecular structures. In molecular graphs, atoms and chemical bonds are represented by vertices and edges, respectively, enabling a mathematical characterization of chemical compounds. In this study, we focus on the two-dimensional (2D) structure of the silicon carbide network ( Si 2 C 3 ). Irregularity indices, first introduced by Paul Erd˝ os, constitute a significant class of topological indices used to quantify the structural irregularity of molecular graphs. These indices play a vital role in understanding the physicochemical properties of chemical networks. We compute sixteen irregularity-based topological indices of the silicon carbide network, including the First Zagreb Index, Second Zagreb Index, Randi´ c Index, Degree Variance, Albertson Irregularity Index, and several other related measures.
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Declarations
Conflict of Interest
The authors confirm that they have no relevant financial or non-financial competing interests. All the authors with the consultation of each other completed this research and drafted the manuscript together.
Funding
The authors declare that this work received no funding support.
Cite This Article
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Moazzma Kashaf, Haseeba Mubeen, Moiza Shaf. A Mathematical Study of Irregularity Indices for the Silicon Carbide Lattice Si p, q. Journal of Emerging Research in Science and Technology, 2026.

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